2004 |
Sheng-Syan Chen;Kim Wai Ho;Cheng-few Lee;Keshab Shrestha, 2004, 'Nonlinear Models in Corporate Finance Research: Review, Critique, and Extensions, ' Review of Quantitative Finance and Accounting, Vol.22, No.2, pp.141-169., vol. 416494, 2004 |
2004 |
Sheng-Syan Chen;Cheng-few Lee;Keshab Shrestha, 2004, 'An Empirical Analysis of the Relationship between the Hedge Ratio and Hedging Horizon: A Simultaneous Estimation of the Short- and Long-Run Hedge Ratios, ' Journal of Futures Markets, Vol.24, No.4, pp.359-386.(SSCI), vol. 416493, 2004 |
2004 |
Shao-Chi Chang;Sheng-Syan Chen;Yichen Liu, 2004, 'Why Firms Use Convertibles: A Further Test of the Sequential-Financing Hypothesis, ' Journal of Banking and Finance, Vol.28, No.5, pp.1163-1183.(SSCI), vol. 416492, 2004 |
2004 |
David K. Ding;Sheng-Syan Chen, 2004, 'The Economy and Demand for Finance Ph.D.s: 1989-2001, ' Research in International Business and Finance, Vol.18, No.3, pp.253-290., vol. 416491, 2004 |
2004 |
洪为玺*;McQueen, R.J., 2004, 'Developing an evaluation instrument for E-Commerce Web sites from the first-time user’s viewpoint, ' Electronic Journal of Information Systems Evaluation, Vol.7 (1), pp.31-42.(*为通讯作者), vol. 417399, 2004 |
2004 |
温肇东, 2004, '科技管理与大学衍生企业在日本的发展, ' 智财评论, Vol.2, No.1, pp.74-96., vol. 174233, 2004 |
2004 |
蔡纹琦;Anirban DasGupta, 2004, 'On the Strong Consistency, Weak Limits and Practical Performance of the ML Estimate and Bayesian Estimates of a Symmetric Domain in R^k, ' A Festschrift for Herman RubinHerman Rubin,., vol. 158811, 2004 |
2004 |
T.-F. Wu;C.-J. Lin;R. C. Weng, 2004, 'Probability Estimates for Multi-class Classification by Pairwise Coupling., ' Journal of Machine Learning Research, Vol.5, pp.975-1005.(SCIE), vol. 156216, 2004 |
2004 |
馀清祥*, 2004, 'Optimal Strategies in a Generalized Two-stage Bandit Promblems, ' Communications in Statistics:Theory and Methods,.(SCI)(*为通讯作者), vol. 147593, 2004 |
2004 |
Yang, S.;Yang, C., 2004, 'Economic Statistical Process Control for Overadjusted Process Mean, ' International Journal Quality and Reliability Management, Vol.21, pp.412-424.(EI), vol. 147670, 2004 |