Year | 2010 |
---|---|
Authors | YI-CHIA CHIU |
Paper Title | Yeh, M.L.;Chu,Y .P.;Sher,P.J.;Chiu, Y.C., 2010, 'R&D Intensity, Firm Performance and the Identification of the Threshold: Fresh Evidence from the Panel Threshold Regression, ' Applied Economics, Vol.42, No.3, pp.389-401.(SSCI) |
Vol.No | 321532 |