年度 | 2010 |
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全部作者 | 邱奕嘉 |
論文名稱 | Yeh, M.L.;Chu,Y .P.;Sher,P.J.;Chiu, Y.C., 2010, 'R&D Intensity, Firm Performance and the Identification of the Threshold: Fresh Evidence from the Panel Threshold Regression, ' Applied Economics, Vol.42, No.3, pp.389-401.(SSCI) |
卷數 | 321532 |